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Scanning Electron Microscopes (SEM)
Desktop SEM
Transmission Electron Microscopes (TEM)
DualBeam Microscopes (FIB/SEM)
Micro-Computed Tomography (µCT)
X-ray Photoelectron Spectrometer (XPS)
Atomic Force Microscopes (AFM)
​3D Optical Microscopes
Nanomechanical Testing
Nanoscale Infrared Spectrometers
Stylus Profilometers
Tribometers & Mechanical Testers
Benchtop 3D X-ray Microscopes (XRM)
Micro X-ray Fluorescence (µXRF)
X-ray Absorption spectroscopy (XAS)
Nano computed tomography (nano-CT)
X-ray Optics (lab & synchrotron)
Mass Photometry (MP)
Optical photothermal Infrared Spectroscopy (O-PTIR)
Infrared+Raman Microscopy
AFM SuppliesSEM SuppliesTEM Supplies
Time-of-flight Secondary Ion Mass Spectrometry
(TOF-SIMS)
Energy Dispersive Spectroscopy (EDS)
Electron Backscatter Diffraction (EBSD)
Wavelength Dispersive Spectrometry (WDS)
Ultra High Vacuum Scanning Probe Microscope
(UHV SPM/STM)
TEM Imaging Systems
Advanced imaging and diffraction for TEM
