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    Thermo Fisher Scientific

    Scanning Electron Microscopes (SEM)

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    Nanomechanical Testing

    Nanoscale Infrared Spectrometers

    Stylus Profilometers

    Tribometers & Mechanical Testers

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    Sigray

    Micro X-ray Fluorescence (µXRF)

    X-ray Absorption spectroscopy (XAS)

    3D X-ray Microscopes

    X-ray Optics (lab & synchrotron)

    Refeyn

    Mass Photometry (MP)

    Photothermal Spectroscopy COrp

    Optical photothermal Infrared Spectroscopy (O-PTIR)

    Infrared+Raman Microscopy

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    TED PELLA

    AFM Supplies
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    IONTOF

    Time-of-flight Secondary Ion Mass Spectrometry

    (TOF-SIMS)

    RHK Technology

    Ultra High Vacuum Scanning Probe Microscope

    (UHV SPM/STM)

    NanoMEGAS

    Advanced imaging and diffraction for TEM