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    Transmission Electron Microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image. The electron beam is impacted by the sample's thickness/density, composition, and, in some case, crystallinity. The electrons that are transmitted through the specimen subsequently provide contrast in the resulting image, revealing high-resolution compositional information.

    Products

    Iliad (S)TEM
    • Integrated Iliad EELS Spectrometer and Energy Filter for advanced spectroscopy.
    • NanoPulser electrostatic beam blanker enabling dose optimization and time-resolved experiments.
    • Live high-tension switching between 30–300 kV for flexible experimental conditions.
    • Velox Software for seamless multimodal data acquisition and processing.
    • AutoScript TEM Software for Python-based automation and AI-driven workflows.
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    Krios 5 Cryo-TEM
    • 300 kV cryo-transmission electron microscope for atomic-resolution cryo-EM.
    • AI-powered Smart EPU software for automated grid screening and data management.
    • Extended aberration-free image shift (AFIS) for faster multigrid data collection.
    • CryoTomo Software Suite with on-the-fly motion correction and 8K EER decoding.
    • Energy-saving Eco modes and ACT Ecolabel for sustainable operation
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    Glacios 2 Cryo-TEM
    • 200 kV cryo-TEM platform for near-atomic resolution across SPA, cryo-ET, and MicroED workflows.
    • Integrated Falcon 4i Direct Electron Detector for highspeed, high-DQE image acquisition.
    • Smart EPU software with AI-driven automation for streamlined setup and real-time feedback.
    • Selectris X Imaging Filter and optional E-CFEG for enhanced contrast and sub-2 Å resolution.
    • Compact enclosure design minimizing environmental interference for stable, high-throughput operation.
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    Tundra Cryo-TEM
    • 100 kV cryo-transmission electron microscope for structural analysis at biologically relevant resolutions.
    • Falcon C Direct Electron Detector enabling highcontrast imaging down to ~2.1 Å resolution.
    • AI-guided automation software for real-time feedback and streamlined data collection workflows.
    • Semi-automated loader system for rapid sample exchange and contamination-free handling.
    • Compact design with simplified operation, making cryo-EM accessible for new and experienced users.
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    Spectra Ultra (S)TEM
    • Fast high-tension switching between 30–300 kV for optimized imaging and spectroscopy.
    • Ultra-X EDX detector with >4.45 sr solid angle for low-dose chemical analysis of beam-sensitive materials.
    • Damage mitigation through voltage switching and advanced EDX for reduced knock-on effects.
    • In situ and dynamic research enabled by wide-gap S-TWIN lens, fast cameras, and smart software.
    • Automation routines like OptiSTEM+ and OptiMono+ for highly repeatable, quantifiable data.
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    Spectra 300 (S)TEM
    • Accelerating voltage range of 30–300 kV for flexible imaging and spectroscopy across materials.
    • Ultra-high-resolution optics with fifth-order probe aberration correction (S-CORR).
    • Multiple electron source options (X-FEG Mono/UltiMono or X-CFEG) for high brightness and energy resolution.
    • Wide-gap S-TWIN pole piece enabling in situ experiments and large tilt angles without compromising resolution.
    • Advanced automation with OptiSTEM+ and OptiMono+ software.
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    Spectra 200 (S)TEM
    • Ultra-high-brightness X-CFEG source for highresolution STEM imaging and fast analytics.
    • S-CORR probe aberration corrector enabling sub-angstrom resolution from 60–200 kV.
    • Wide-gap S-TWIN/X-TWIN lens design for in situ experiments without compromising resolution.
    • Integrated EDS and EELS detection systems for simultaneous chemical and structural analysis.
    • Advanced automation routines like OptiSTEM+ for repeatable, quantifiable high-resolution data.
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    Talos F200S TEM
    • High-resolution TEM and STEM imaging combined with rapid, quantitative EDS analysis.
    • Integrated Velox Software for fast, intuitive acquisition and multimodal data analysis.
    • Dual in-column Super-X SDD detectors enabling precise chemical composition mapping.
    • Smart scanning engine with multi-channel STEM detection for improved image quality.
    • Enhanced environmental stability with instrument enclosure and full remote operation.
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    Talos F200i TEM
    • 20–200 kV field emission (S)TEM for high-resolution 2D/3D imaging and diffraction applications.
    • Standard X-Twin pole piece gap enabling flexible in situ experiments and tomography workflows.
    • Ultra-high brightness FEG options (S-FEG, X-FEG, XCFEG) for superior imaging and energy resolution.
    • Dual-X EDS configuration with up to 100 mm² detectors for fast, accurate chemical analysis.
    • Integrated Velox software and Align Genie
      automation for streamlined operation and
      reproducible results.
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    Talos F200E TEM
    • High-resolution STEM and TEM imaging with minimal distortion for semiconductor analysis.
    • Rapid, precise EDS acquisition and integrated EELS for comprehensive chemical characterization.
    • Simultaneous multi-signal detection with contrastoptimized imaging and live TEM image rotation.
    • Advanced semiconductor-specific features like iDPC imaging, STEM field-of-view matching, and driftcorrected
      frame integration.
    • Velox Software for streamlined workflows and instant EDS map quantification with Super-X or Dual-X detector options.
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    Talos F200X TEM
    • High-resolution TEM and STEM imaging combined with industry-leading Super-X™ EDS detection.
    • 4 in-column SDD detectors enabling fast, clean 2D/3D compositional mapping and quantitative characterization.
    • Wide X-TWIN pole piece gap for flexible in situ experiments, tomography, and diffraction applications.
    • Integrated Velox™ software with automated workflows like Align Genie.
    • Available with high-brightness X-FEG or ultra-high brightness X-CFEG for superior imaging and energy resolution.
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    Talos F200C TEM
    • 20–200 kV thermionic (S)TEM for high-contrast imaging of beam-sensitive materials.
    • Large C-Twin pole piece gap enabling flexible applications like 3D tomography, in situ observations, and diffraction.
    • Optional motorized retractable cryo-box and lowdose techniques for superior cryo-TEM performance.
    • Integrated 4k × 4k Ceta 16M camera for fast imaging with large field-of-view and high sensitivity.
    • Thermo Scientific Maps Software for automated largearea image stitching and correlative workflows across TEM, SEM, and light microscopy.
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    Talos 12 TEM
    • Proven 120 kV TEM performance with constant-power objective lens for high optical stability.
    • Integrated Ceta CMOS camera and STEM detectors for high-contrast imaging and fast acquisition.
    • Modular design supporting TEM, STEM, EDS, and entry-level cryo-EM applications for versatile workflows.
    • User-friendly Velox and Maps 3 software enabling automated large-area imaging and remote operation.
    • Robust enclosure with improved accessibility and long-duration dewar for extended unattended sessions.
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    Metrios AX TEM
    • Fully automated TEM and STEM workflows for high-volume semiconductor metrology.
    • Metrology accuracy below 0.75% combined error in distortion and magnification calibration.
    • Smart Automation software with machinelearning algorithms for recipe-free operation.
    • Integrated Ultra-X EDS detector and hybrid metrology for fast elemental analysis.
    • Smart Stage with piezo-driven tilt for precise ROI navigation and improved throughput.
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    Metrios 6 (S)TEM
    • Fully automated TEM and STEM metrology workflows for high-volume semiconductor
      manufacturing.
    • Smart Automation software with machine-learning algorithms.
    • Ultra-X EDS detection system delivering 2× faster elemental analysis and improved performance.
    • Newly designed Smart Stage with piezo-driven tilt.
    • High-brightness X-CFEG source and constant power lenses enabling rapid voltage switching.
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    Metrios 6S (S)TEM
    • Fully automated TEM imaging and metrology workflows.
    • Integration with Vulcan Automated Lab for SEMIstandard-compliant TEM grid handling and seamless host connectivity.
    • Smart Automation software with recipe-free operation and advanced AI algorithms.
    • Ultra-X EDS detector delivering at least 2× faster elemental analysis.
    • Piezo-driven Smart Stage combined with automated TEM grid transfer.
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    Themis ETEM
    • Fully integrated TEM/STEM platform with dedicated environmental TEM mode.
    • NanoEx-i/v heating stage enabling precise sample temperature control.
    • Piezo-enhanced stage with drift correction across x, y, and z axes for improved sample stability.
    • Advanced imaging and movie acquisition system combining high sensitivity, large field of view, and high dynamic range.
    • Built-in gas analysis via mass spectrometer, plasma cleaning system, and automated vacuum switching.
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    Applications

    Not sure which system best fits your needs?

    Our team can help you compare options and determine the right configuration for your application.

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