Transmission Electron Microscopy (TEM) - Systems for Research

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Transmission Electron Microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image. The electron beam is impacted by the sample's thickness/density, composition, and, in some case, crystallinity. The electrons that are transmitted through the specimen subsequently provide contrast in the resulting image, revealing high-resolution compositional information.

Products

Integrated Iliad EELS Spectrometer and Energy Filter for advanced spectroscopy.
NanoPulser electrostatic beam blanker enabling dose optimization and time-resolved experiments.
Live high-tension switching between 30–300 kV for flexible experimental conditions.
Velox Software for seamless multimodal data acquisition and processing.
AutoScript TEM Software for Python-based automation and AI-driven workflows.

Krios 5 Cryo-TEM

300 kV cryo-transmission electron microscope for atomic-resolution cryo-EM.
AI-powered Smart EPU software for automated grid screening and data management.
Extended aberration-free image shift (AFIS) for faster multigrid data collection.
CryoTomo Software Suite with on-the-fly motion correction and 8K EER decoding.
Energy-saving Eco modes and ACT Ecolabel for sustainable operation

Glacios 2 Cryo-TEM

200 kV cryo-TEM platform for near-atomic resolution across SPA, cryo-ET, and MicroED workflows.
Integrated Falcon 4i Direct Electron Detector for highspeed, high-DQE image acquisition.
Smart EPU software with AI-driven automation for streamlined setup and real-time feedback.
Selectris X Imaging Filter and optional E-CFEG for enhanced contrast and sub-2 Å resolution.
Compact enclosure design minimizing environmental interference for stable, high-throughput operation.

Tundra Cryo-TEM

100 kV cryo-transmission electron microscope for structural analysis at biologically relevant resolutions.
Falcon C Direct Electron Detector enabling highcontrast imaging down to ~2.1 Å resolution.
AI-guided automation software for real-time feedback and streamlined data collection workflows.
Semi-automated loader system for rapid sample exchange and contamination-free handling.
Compact design with simplified operation, making cryo-EM accessible for new and experienced users.

Spectra Ultra (S)TEM

Fast high-tension switching between 30–300 kV for optimized imaging and spectroscopy.
Ultra-X EDX detector with >4.45 sr solid angle for low-dose chemical analysis of beam-sensitive materials.
Damage mitigation through voltage switching and advanced EDX for reduced knock-on effects.
In situ and dynamic research enabled by wide-gap S-TWIN lens, fast cameras, and smart software.
Automation routines like OptiSTEM+ and OptiMono+ for highly repeatable, quantifiable data.

Spectra 300 (S)TEM

Accelerating voltage range of 30–300 kV for flexible imaging and spectroscopy across materials.
Ultra-high-resolution optics with fifth-order probe aberration correction (S-CORR).
Multiple electron source options (X-FEG Mono/UltiMono or X-CFEG) for high brightness and energy resolution.
Wide-gap S-TWIN pole piece enabling in situ experiments and large tilt angles without compromising resolution.
Advanced automation with OptiSTEM+ and OptiMono+ software.

Spectra 200 (S)TEM

Ultra-high-brightness X-CFEG source for highresolution STEM imaging and fast analytics.
S-CORR probe aberration corrector enabling sub-angstrom resolution from 60–200 kV.
Wide-gap S-TWIN/X-TWIN lens design for in situ experiments without compromising resolution.
Integrated EDS and EELS detection systems for simultaneous chemical and structural analysis.
Advanced automation routines like OptiSTEM+ for repeatable, quantifiable high-resolution data.

Talos F200S TEM

High-resolution TEM and STEM imaging combined with rapid, quantitative EDS analysis.
Integrated Velox Software for fast, intuitive acquisition and multimodal data analysis.
Dual in-column Super-X SDD detectors enabling precise chemical composition mapping.
Smart scanning engine with multi-channel STEM detection for improved image quality.
Enhanced environmental stability with instrument enclosure and full remote operation.

Talos F200i TEM

20–200 kV field emission (S)TEM for high-resolution 2D/3D imaging and diffraction applications.
Standard X-Twin pole piece gap enabling flexible in situ experiments and tomography workflows.
Ultra-high brightness FEG options (S-FEG, X-FEG, XCFEG) for superior imaging and energy resolution.
Dual-X EDS configuration with up to 100 mm² detectors for fast, accurate chemical analysis.
Integrated Velox software and Align Genie
automation for streamlined operation and
reproducible results.

Talos F200E TEM

High-resolution STEM and TEM imaging with minimal distortion for semiconductor analysis.
Rapid, precise EDS acquisition and integrated EELS for comprehensive chemical characterization.
Simultaneous multi-signal detection with contrastoptimized imaging and live TEM image rotation.
Advanced semiconductor-specific features like iDPC imaging, STEM field-of-view matching, and driftcorrected
frame integration.
Velox Software for streamlined workflows and instant EDS map quantification with Super-X or Dual-X detector options.

Talos F200X TEM

High-resolution TEM and STEM imaging combined with industry-leading Super-X™ EDS detection.
4 in-column SDD detectors enabling fast, clean 2D/3D compositional mapping and quantitative characterization.
Wide X-TWIN pole piece gap for flexible in situ experiments, tomography, and diffraction applications.
Integrated Velox™ software with automated workflows like Align Genie.
Available with high-brightness X-FEG or ultra-high brightness X-CFEG for superior imaging and energy resolution.

Talos F200C TEM

20–200 kV thermionic (S)TEM for high-contrast imaging of beam-sensitive materials.
Large C-Twin pole piece gap enabling flexible applications like 3D tomography, in situ observations, and diffraction.
Optional motorized retractable cryo-box and lowdose techniques for superior cryo-TEM performance.
Integrated 4k × 4k Ceta 16M camera for fast imaging with large field-of-view and high sensitivity.
Thermo Scientific Maps Software for automated largearea image stitching and correlative workflows across TEM, SEM, and light microscopy.

Proven 120 kV TEM performance with constant-power objective lens for high optical stability.
Integrated Ceta CMOS camera and STEM detectors for high-contrast imaging and fast acquisition.
Modular design supporting TEM, STEM, EDS, and entry-level cryo-EM applications for versatile workflows.
User-friendly Velox and Maps 3 software enabling automated large-area imaging and remote operation.
Robust enclosure with improved accessibility and long-duration dewar for extended unattended sessions.

Fully automated TEM and STEM workflows for high-volume semiconductor metrology.
Metrology accuracy below 0.75% combined error in distortion and magnification calibration.
Smart Automation software with machinelearning algorithms for recipe-free operation.
Integrated Ultra-X EDS detector and hybrid metrology for fast elemental analysis.
Smart Stage with piezo-driven tilt for precise ROI navigation and improved throughput.

Metrios 6 (S)TEM

Fully automated TEM and STEM metrology workflows for high-volume semiconductor
manufacturing.
Smart Automation software with machine-learning algorithms.
Ultra-X EDS detection system delivering 2× faster elemental analysis and improved performance.
Newly designed Smart Stage with piezo-driven tilt.
High-brightness X-CFEG source and constant power lenses enabling rapid voltage switching.

Metrios 6S (S)TEM

Fully automated TEM imaging and metrology workflows.
Integration with Vulcan Automated Lab for SEMIstandard-compliant TEM grid handling and seamless host connectivity.
Smart Automation software with recipe-free operation and advanced AI algorithms.
Ultra-X EDS detector delivering at least 2× faster elemental analysis.
Piezo-driven Smart Stage combined with automated TEM grid transfer.

Fully integrated TEM/STEM platform with dedicated environmental TEM mode.
NanoEx-i/v heating stage enabling precise sample temperature control.
Piezo-enhanced stage with drift correction across x, y, and z axes for improved sample stability.
Advanced imaging and movie acquisition system combining high sensitivity, large field of view, and high dynamic range.
Built-in gas analysis via mass spectrometer, plasma cleaning system, and automated vacuum switching.

Applications

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