Systems for Research (SFR) has been collaborating with universities, industry, and health science institutions for over 30 years, to offer an array of cutting-edge scientific instrumentation and provide greater visibility into the molecular world.
SFR has an expansive in-house service team situated across Canada to provide our clients with uninterrupted and on-going local support for their research needs.
Our mission is to empower researchers and industry professionals in surface material research by offering state-of-the-art microscopy instruments and ongoing local support for all of their research needs.
We aim to revolutionize surface material research through microscopy technologies combined with exceptional service setting new standards for accuracy, innovation, and breakthrough discoveries.
Scanning Electron Microscopes (SEM)
Transmission Electron Microscopes (TEM)
DualBeam Microscopes (FIB/SEM)
X-ray Photoelectron Spectrometer (XPS)
Atomic Force Microscopes (AFM)
3D Optical Microscopes
Nanoscale Infrared Spectrometers
Tribometers & Mechanical Testers
Benchtop 3D X-ray Microscopes (XRM)
Micro X-ray Fluorescence (µXRF)
X-ray Absorption spectroscopy (XAS)
3D X-ray Microscopes
X-ray Optics (lab & synchrotron)
Mass Photometry (MP)
Optical photothermal Infrared Spectroscopy (O-PTIR)
Cryo - EM Supplies
Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Ultra High Vacuum Scanning Probe Microscope (UHV SPM/STM)
Advanced imaging and diffraction for TEM
A pillar of contemporary scientific research, nanotechnology - the manipulation of matter at the atomic and molecular scale, has emerged as a cornerstone of modern scientific inquiry, offering unprecedented opportunities across a multitude of disciplines. In this blog, we embark on a journey to explore the diverse and transformative applications of nanotechnology, ranging from healthcare and electronics to environmental remediation and beyond.
X-ray microscopy (XRM) is a powerful tool for the analysis of the structure of materials at various length scales, ranging from microns to nanometers. The approach measures the absorption of x-rays to form images of the internal structures of intact samples after or during charging cycles.