Systems for Research (SFR) has been collaborating with universities, industry, and health science institutions for over 30 years, to offer an array of cutting-edge scientific instrumentation and provide greater visibility into the molecular world.
SFR has an expansive in-house service team situated across Canada to provide our clients with uninterrupted and on-going local support for their research needs.
Scanning Electron Microscopes (SEM)
Transmission Electron Microscopes (TEM)
DualBeam Microscopes (FIB/SEM)
X-ray Photoelectron Spectrometer (XPS)
Atomic Force Microscopes (AFM)
3D Optical Microscopes
Nanoscale Infrared Spectrometers
Tribometers & Mechanical Testers
Benchtop 3D X-ray Microscopes (XRM)
Micro X-ray Fluorescence (µXRF)
X-ray Absorption spectroscopy (XAS)
3D X-ray Microscopes
X-ray Optics (lab & synchrotron)
Mass Photometry (MP)
Optical photothermal Infrared Spectroscopy (O-PTIR)
Cryo - EM Supplies
Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Ultra High Vacuum Scanning Probe Microscope (UHV SPM/STM)
Advanced imaging and diffraction for TEM
Systems for Research is proud to announce the release of a new white paper titled “In Situ X-ray Approaches in Battery Research” by its leading partner, Sigray. The paper effectively highlights the development of a suite of groundbreaking lab-based x-ray tools for energy research with performance capabilities approaching that of synchrotron-based approaches.
The new paper titled “ Characterization of Virus Particles and Submicron-Sized Particulate Impurities in Recombinant Adeno-Associated Virus Drug Product” published by Boehringer Ingelheim explore the benefits of MP analysis for assessing aggregate content in AAV samples.
Although low counts for aggregates impeded a quantitative analysis, MP was affirmed as an accurate and rapid method for quantifying the genome content of empty/filled/double-filled capsids.
Systems for Research (SFR) is proud to announce the latest product solution – featurefindIR™ by its leading partner, Photothermal Spectroscopy Corp (PSC).
The featurefindIR provides rapid, automated detection, spectroscopic measurement, and chemical identification of microplastics and other particles, significantly improving the productivity of measurement and providing a basis for measurements of large number of samples in applications including but not limited to microplastics, defect contamination and cells analysis, as well as many other sample types.