Your Cart is Empty
Within the semiconductor and nanotechnology research community, one of the main capabilities sought is the capacity to quickly, non-destructively, and quantitatively analyze the composition of trace level dopants and nanostructures. Modern 3D finFET transistors, which are non-planar and generally use single-digit nanometer high-K dielectric insulators in place of SiO2 gate oxides, are an example of the technological advancements in electronics and materials that have created the necessity for this kind of learning.
In the realm of nanotechnology and materials science, the ability to visualize and analyze structures at the nanoscale is paramount. Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) stand as two powerful tools at the forefront of this exploration, each offering unique insights into the microcosmos of materials. In this article, we embark on a comparative journey to understand the differences, strengths, and applications of SEM and TEM.
A pillar of contemporary scientific research, nanotechnology - the manipulation of matter at the atomic and molecular scale, has emerged as a cornerstone of modern scientific inquiry, offering unprecedented opportunities across a multitude of disciplines. In this blog, we embark on a journey to explore the diverse and transformative applications of nanotechnology, ranging from healthcare and electronics to environmental remediation and beyond.
