An acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time-of-Flight mass analysis (TOF), this sensitive technique is well established for many industrial and research applications.
X-ray microscopy (XRM) is a powerful tool for the analysis of the structure of materials at various length scales, ranging from microns to nanometers. The approach measures the absorption of x-rays to form images of the internal structures of intact samples after or during charging cycles.
When it comes to AAV sample quality, the total concentration of AAV capsid in a sample, or capsid tier is a critical factor that influences the aggregation and represents important information for downstream recovery and purification processes.
With the advent of simultaneous submicron IR+Raman spectral acquisition, not only are the IR and Raman spectra simultaneously collected, but now the spectral search of both IR and Raman spectral occurs simultaneously, with a single click from the data acquisition software.