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The Benefits of Investing in Research Infrastructure: A Nanotechnology Perspective

The Benefits of Investing in Research Infrastructure: A Nanotechnology Perspective

July 02, 2024 3 min read

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Applications of AFM in Surface Characterization: Probing Nanoscale Features

Applications of AFM in Surface Characterization: Probing Nanoscale Features

June 11, 2024 3 min read

In the world of surface science, the ability to observe and manipulate materials at the nanoscale has revolutionized countless fields, from materials science to biology. Atomic force microscopy (AFM) is a potent technology at the center of this revolution.
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Why use an SEM in Battery Research?

Why use an SEM in Battery Research?

June 07, 2024 3 min read

In the realm of scientific research, particularly in the study of batteries, precision and detailed analysis are paramount. One of the key tools that researchers rely on is the Scanning Electron Microscope (SEM). In this blog, we dive into some of the reasons why this is the case. 
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Unlocking Molecular Insights: Exploring the Benefits and Limitations of Mass Photometry

Unlocking Molecular Insights: Exploring the Benefits and Limitations of Mass Photometry

May 22, 2024 3 min read

 Mass Photometry has emerged as a powerful tool for precisely measuring the mass of individual biomolecules in solution. In this article, we'll delve into the benefits and limitations of Mass Photometry, shedding light on its capabilities and potential applications.
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Which SPM is right for you?

Which SPM is right for you?

May 08, 2024 2 min read

In the vast landscape of scientific research and nanotechnology, Scanning Probe Microscopy (SPM) stands tall as a cornerstone technique for probing surfaces at the nanoscale. With applications spanning materials science, biology, chemistry, and physics, choosing the right SPM system can be a crucial decision for researchers and industry professionals alike. 
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Dopant and Thin Film Analysis at Sub-Å Equivalent Thickness

Dopant and Thin Film Analysis at Sub-Å Equivalent Thickness

March 28, 2024 3 min read

Within the semiconductor and nanotechnology research community, one of the main capabilities sought is the capacity to quickly, non-destructively, and quantitatively analyze the composition of trace level dopants and nanostructures. Modern 3D finFET transistors, which are non-planar and generally use single-digit nanometer high-K dielectric insulators in place of SiO2 gate oxides, are an example of the technological advancements in electronics and materials that have created the necessity for this kind of learning.

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