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In the realm of nanotechnology and materials science, the ability to visualize and analyze structures at the nanoscale is paramount. Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) stand as two powerful tools at the forefront of this exploration, each offering unique insights into the microcosmos of materials. In this article, we embark on a comparative journey to understand the differences, strengths, and applications of SEM and TEM.
A pillar of contemporary scientific research, nanotechnology - the manipulation of matter at the atomic and molecular scale, has emerged as a cornerstone of modern scientific inquiry, offering unprecedented opportunities across a multitude of disciplines. In this blog, we embark on a journey to explore the diverse and transformative applications of nanotechnology, ranging from healthcare and electronics to environmental remediation and beyond.
X-ray microscopy (XRM) is a powerful tool for the analysis of the structure of materials at various length scales, ranging from microns to nanometers. The approach measures the absorption of x-rays to form images of the internal structures of intact samples after or during charging cycles.
