An acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time-of-Flight mass analysis (TOF), this sensitive technique is well established for many industrial and research applications.
X-ray microscopy (XRM) is a powerful tool for the analysis of the structure of materials at various length scales, ranging from microns to nanometers. The approach measures the absorption of x-rays to form images of the internal structures of intact samples after or during charging cycles.
When it comes to AAV sample quality, the total concentration of AAV capsid in a sample, or capsid tier is a critical factor that influences the aggregation and represents important information for downstream recovery and purification processes.
With the advent of simultaneous submicron IR+Raman spectral acquisition, not only are the IR and Raman spectra simultaneously collected, but now the spectral search of both IR and Raman spectral occurs simultaneously, with a single click from the data acquisition software.
Sigray AttoMap microXRF is truly unbeatable as it provides unprecedented sensitivity to detect heavy and even light elements (e.g., C, O, N) that are too low concentration to be measured using electron-based techniques such as SEM-EDS and EPMA or other microXRF systems.
