Introducing the Newest Members of the SFR Team, Ajin and Debora!

January 19, 2024 1 min read

Introducing the Newest Members of the SFR Team, Ajin and Debora!

As we begin the new year, it is a pleasure to introduce the newest members of the Systems for Research (SFR) team!

Ajin S Kurian is joining the team as Phenom Field Service Representative, eager to take Systems for Research (SFR) to new heights with an experience spanning across 9 years.

Debora R. Martins will be our Admin/Customer Service Support Thermo Fisher Scientific and will join our operations team working to provide our customers support for their research needs.

We're excited to have you both join us and can't wait to see what we accomplish together!


Also in News

Applications of Nanotechnology: Building at the Nanoscale
Applications of Nanotechnology: Building at the Nanoscale

February 21, 2024 2 min read

A pillar of contemporary scientific research, nanotechnology -  the manipulation of matter at the atomic and molecular scale, has emerged as a cornerstone of modern scientific inquiry, offering unprecedented opportunities across a multitude of disciplines. In this blog, we embark on a journey to explore the diverse and transformative applications of nanotechnology, ranging from healthcare and electronics to environmental remediation and beyond. 

Read More
TOF-SIMS Technique: Advanced Ion Beam Technology for Surface Analysis
TOF-SIMS Technique: Advanced Ion Beam Technology for Surface Analysis

February 07, 2024 2 min read

An acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time-of-Flight mass analysis (TOF), this sensitive technique is well established for many industrial and research applications.
Read More
X-ray Diffraction (XRD) to study the crystal structure and bond lengths of battery materials.
X-ray Diffraction (XRD) to study the crystal structure and bond lengths of battery materials.

January 31, 2024 3 min read

X-ray microscopy (XRM) is a powerful tool for the analysis of the structure of materials at various length scales, ranging from microns to nanometers. The approach measures the absorption of x-rays to form images of the internal structures of intact samples after or during charging cycles.

 

Read More