Variable Tilt Specimen Holder

  • SEM Pin Mount Specimen Holders
    for Scanning Electron Microscopy

    A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
    Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs

    Accommodates pin stubs up to 18mm (.7") (pin stub can be locked with set screw in tilt table) or larger specimens with a maximum size of 26 x 20mm. Tilts 0 - 90° with 10° markings. Additional markings for 30°, 45°, and 70°. Tilt table size is 26 x 20mm, overall size is 33 x 20 x 19mm H. Made of aluminum with stainless steel screws. Allen wrench included.
    Screws used are M2 x 0.4mm x 6mm Hex SHCS and M2 x 0.4mm x 3mm Hex Socket type 1 Cup Pt-SS