The problem: Blunt or broken tips falsify measurement results like surface roughness or structures dimensions dramatically! To ensure correct results, used tips must be thrown away or checked by SEM regularly, both methods being extremely uneconomic or time consuming.
The solution: The TipCheck is an SPM sample for fast and convenient determination of the AFM tip condition. It offers a fast and easy way to compare and categorize different AFM probes with respect to tip apex shape and sharpness.
Check whether your tip is still good, starts showing wear or already blunted without the need of scanning an entire image or doing an SEM inspection!
Additionally, this sample works perfectly with Auto Tip Qualification and Tip Characterization software that is available on the market.
The three figures show a comparison between different probe tips used to image the TipCheck sample.
The TipCheck sample consists of an extremely wear-resistant thin film coating that is deposited on a silicon chip. This thin film coating shows a granular, sharply peaked nanostructure which makes it ideal for reversely imaging an AFM probe’s tip apex.
The die size of the TipCheck is 5x5mm. It is available either mounted onto a 12mm metal disc or unmounted (TipCheck-UM).