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    Web Store / Products / TESP-SS
    TESP-SS - Systems for Research

    TESP-SS

    TESP-SS

    $1,102.50
    42N/m, 320kHz, Supersharp Tip, No Coating

    • Super Sharp TESP Probe
      - 42N/m, 320kHz
      - 2-5nm Tip Radius of Curvature
      - Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200nm of the tip apex.
      - 10-Pack of Probes

    • Tip Geometry: Super Sharp
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 15 ± 2.5
      Side Angle: 22.5 ± 2.5
      Tip Radius (Nom): 2
      Tip Radius (Max): 5
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 4
      Cantilever Thickness (RNG): 3.5 - 4.5
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1