SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
This TEM grid holder holds up to 4 TEM grids. It enables imaging and analyzing specimens on TEM grids in the SEM. For EDS applications it is beneficial to place thin films on a TEM grid or small particles on a TEM grid with a support film. This can significantly reduce background in the EDS spectrum and increase detection limits of the EDS detector. Hole size in the top and base is ø2.1mm. Opening angle on the holes in the top and base is 120° to reduce electron scattering and improve X-ray collection. Overall diameter is 18mm (0.7"), standard 3.2mm (1/8") pin with a 15mm (0.6") long pin. The longer pin allows for a larger distance from the SEM stage pin holder and therefore greatly reduces electron and X-ray scattering contribution for the SEM stage. TEM grid locations are numbered. Material: vacuum grade aluminum with brass screw.
Screw used is 2-56 x 3/16, Flat, Brass
TEM Grid Holder for 4 Grids, Pin