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    SiNi - Systems for Research
    SiNi - Systems for Research
    SiNi - Systems for Research
    SiNi - Systems for Research
    SiNi - Systems for Research
    SiNi - Systems for Research

    SiNi-10

    SiNi

    $387.10
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    Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip

    • Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip

      This competitively priced silicon nitride AFM probe features:

      • 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
      • silicon nitride wedge tip
      • overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
      • macroscopic half cone angle of 35°
        450 micron thick silicon holder chip




    • AFM Tip

      SHAPE Pyramid
      Tip Height 12µm - From 10µm To 14µm
      Tip Radius < 15nm
      Half Cone Angle 35° (macroscopic)
    • Cantilever A - Contact Mode Cantilever B - Force Modulation
      Shape Triangle Shape Beam
      Force Constant 0.27 Force Constant 0.06N/m
      Resonance Frequency 30kHz Resonance Frequency 10kHz
      Length 100µm - From 90µm To 110µm Length 200µm - From 190µm To 210µm
      Width 16µm - From 11µm To 21µm Width 30µm - From 25µm To 35µm
      Thickness 0.52µm - From 0.47µm To 0.57µm Thickness 0.52µm - From 0.47µm To 0.57µm