***Note: Bruker's new MESP-HM-V2 probe replaces the legacy MESP-HM probe. Bruker recommends transitioning to this probe. The legacy MESP-HM is still available for ordering while supplies last, at which point in will become obsolete.
Bruker's MESP-HM-V2 is the established choice for Magnetic Force Microscopy. Built on the high-performance RFESP-75 AFM probe, the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast. This cost-effective probe has a nominal tip radius of 80 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating.
The MESP-HM-V2 has a nominal coercivity of 400 Oe (medium), and a magnetic moment of 3e-13 EMU (high).
The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.
The new design provides:
|Tip Height:||10 - 15|
|Front Angle:||17.5 Â± 2.5|
|Back Angle:||25 Â± 2.5|
|Side Angle:||20 Â± 2.5|
|Tip Radius (Nom):||80|
|Tip Radius (Max):||100|
|Tip Set Back (Nom):||9.5|
|Tip Set Back( RNG):||7 - 12|
|Cantilever Material:||0.01 - 0.025 Î©cm Antimony (n) doped Si|
|Cantilever Thickness (Nom):||2.8|
|Cantilever Thickness (RNG):||2.05 - 3.55|
|Front Side Coating:||Magnetic CoCr|
|Back Side Coating:||Reflective CoCr|