LTESPA-V2

LTESPA-V2

48N/m, 190kHz, 4-Sided Tip, Al Reflex Coating, 10-Pack

  • A pack of 10 High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes.

    Unmounted for use on standard AFM's.

    Bruker AFM Probes has introduced an improved version of its popular, LTESP/LTESPA AFM probes. Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air.

    The new design provides:

    • Tighter dimensional specifications for improved probe to probe consistency
    • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
    • Improved probe quality and aesthetics

    This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESP-V2.


  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5
    Back Angle: 15 ± 2.5
    Side Angle: 22.5 ± 2.5
    Tip Radius (Nom): 8
    Tip Radius (Max): 12
    Tip Set Back (Nom): 15
    Tip Set Back( RNG): 5 - 25
  • Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.

    Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 6.8
    Cantilever Thickness (RNG): 5.8 - 7.8
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1
    Back Side Coating: Reflective Aluminum