Menu
0
    0

    Your Cart is Empty

           
    Web Store / Products / FESPA-V2
    FESPA-V2 - Systems for Research

    FESPA-V2

    FESPA-V2

    $521.42
    2.8N/m, 75kHz, 4 Sided Tip, Al Reflex Coating, 10-Pack

    • A pack of 10 High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air. 

      Unmounted for use on standard AFM's.

      Bruker AFM Probes has introduced an improved version of its popular,FESP/FESPA AFM probes. Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air.

      The new design provides:

      •   Tighter dimensional specifications for improved probe to probe consistency
      •   Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      • Improved probe quality and aesthetics

      This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2.


    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 15 ± 2.5
      Side Angle: 22.5 ± 2.5
      Tip Radius (Nom): 8
      Tip Radius (Max): 12
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25
    • The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.

      Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 2.75
      Cantilever Thickness (RNG): 2.0 - 3.5
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum