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    Web Store / Products / ElectriMulti75-G
    ElectriMulti75-G - Systems for Research
    ElectriMulti75-G - Systems for Research
    ElectriMulti75-G - Systems for Research
    ElectriMulti75-G - Systems for Research
    ElectriMulti75-G - Systems for Research
    ElectriMulti75-G - Systems for Research

    Multi75E-G-10

    ElectriMulti75-G

    $365.80
    Select Quantity
    Electrical, Force Modulation AFM Probe

    • Electrical, Force Modulation AFM Probe

      Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

      • scanning capacitance microscopy (SCM)
      • electrostatic force microscopy (EFM)
      • Kelvin probe force microscopy (KFM)
      • scanning probe lithography

      The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

      The AFM holder chip fits most commercial AFM systems as it is industry standard size.




    • AFM Tip

      SHAPE Rotated
      Tip Height 17µm
      From 15µm To 19µm
      Tip Setback 15µm
      From 10µm To 20µm
      Tip Radius < 25nm
      Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

    • AFM Cantilever

      Shape Beam
      Force Constant 3N/m - From 1N/m To 7N/m
      Resonance Frequency 75kHz - From 60kHz To 90kHz
      Length 225µm - From 215µm To 235µm
      Width 50µm - From 45µm To 55µm
      Thickness 3µm - From 2µm To 4µm