4 levers 0.06-0.35N/m; Au Reflex Coating

  • Bruker's robust Silicon Nitride AFM probes have soft Silicon Nitride cantilevers with Silicon Nitride tips, and are ideal for contact imaging modes, lateral force microscopy,force modulation microscopy, and liquid operation.  The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.

    Each unmounted probe comes with four different cantilevers of various dimensions, resulting in four unique nominal values for force constant and resonant frequency.  The DNP-10 cantilever layout consists of an "A"and "B" cantilevers on one side of the probe, and "C" and "D" cantilevers on the other side of the probe.  See the cantilever orientation diagram here.  All cantilevers on the Silicon Nitride probes have less than 2 degrees of cantilever bend. 

    For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model SNL-10.

  • Tip Geometry: Rotated (Symmetric)
    Tip Height: 2.5 - 8.0
    Front Angle: 15 ± 2.5
    Back Angle: 25 ± 2.5
    Side Angle: 17.5 ± 2.5
    Tip Radius (Nom): 20
    Tip Radius (Max): 60
    Tip Set Back (Nom): 4
    Tip Set Back( RNG): 0 - 7

  • Cantilever Material: Silicon Nitride
    Cantilever Thickness (Nom): 0.6
    Cantilever Thickness (RNG): 0.55 - 0.65
    Cantilever Geometry: Triangular
    Cantilevers Number: 4
    Back Side Coating: Reflective Gold