Bruker DDESP-V2 Electrical Probes
***Note: Bruker's new DDESP-V2 probe replaces the legacy DDESP-10 probe.Bruker recommends transitioning to this probe. The legacy DDESP-10 is no longer available for ordering.
Providing consistent performance and high sensitivity.
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.
The DDESP-V2 probe provides:
Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFMand PeakForce TUNA), and other electrical characterization applications.
For the highest resolution SSRM measurements, Bruker also offers solid diamond probes with pyramidal tips; please see model SSRM-DIA.
For non-electrical applications where wear resistance is required, the diamond-like carbon (DLC) coated probes, Model TESPD provide a cost effective alternative.
Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM and PeakForce TUNA modes.
|Tip Geometry:||Standard (Steep)|
|Tip Height:||10 - 15|
|Front Angle:||25 ± 2.5|
|Back Angle:||17.5 ± 2.5|
|Side Angle:||20 ± 2.5|
|Tip Radius (Nom):||100|
|Tip Radius (Max):||150|
|Tip Coating:||Conductive Diamond|
|Tip Set Back (Nom):||14|
|Tip Set Back( RNG):||11 - 16|
|Cantilever Material:||0.010-0.025 Ωcm Antimony (n) doped Si|
|Cantilever Thickness (Nom):||3.6|
|Cantilever Thickness (RNG):||2.85 - 4.35|
|Front Side Coating:||Conductive Diamond|
|Back Side Coating:||Reflective Aluminum|