SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
This compact variable tilt specimen mount allows for easy mounting and tilting small samples from 0° – 90° and SEM investigation with small working distances. Markings for 30°, 45°, 70° and 90°. Table size is 11x14mm (0.46" x 0.55"). Overall size is 14 x 14.3 x14.5mm (0.55" x 0.56" x 0.57"). Made of aluminum with stainless steel screw. Allen wrench included.
Screw used is M2 x 0.4mm x 12mm Hex SHCS