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    Web Store / Products / CDP55L
    CDP55L - Systems for Research

    CDP55L

    CDP55L

    $2,494.80
    Round Post Tips for Depth Metrology
    Max W = 55 nm, Max EL = 1000 nm

    • Round Post Tips for Depth Metrology
      Max Width = 55 nm
      Max Effective Length = 1000 nm

    • Tip Geometry: Critical Dimension (Overhang)
      Tip Height: 10 - 20
      Tip Set Back( RNG): 5 - 15
    • The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. It is to assist the machine vision application on Automated AFMs.

      Cantilever Material: 0.010 - 0.025 Ωcm Silicon
      Cantilever Thickness (Nom): 3.3
      Cantilever Thickness (RNG): 2.8 - 3.8
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum