145nm AFM Reference Standard, Certified, Non-traceable, Mounted on disk:
145nm AFM Reference Standard, Certified, Non-traceable, Unmounted:
Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements.
Period:145nm pitch nominal, one dimensional array. Accuracy is +/- 1nm. Calibration certificate will give the actual pitch of the standard.
Surface structure:Aluminum lines on glass, 4x6mm dimensions. Line height (about 100nm) and line width (about 75nm) are not calibrated.
Usability:The calibrated pattern covers the entire standard. There is sufficient usable area to make tens of thousands of measurements without reusing any areas contaminated or altered by previous scans.
AFM:Use in contact, tapping and other modes with image sizes from 250nm to 10um. Available unmounted or mounted on a 12mm steel AFM disk.
Certification:Comes with a non-traceable manufacturer's certificate stating average pitch, based on batch measurements.