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    Web Store / Ted Pella

    Ted Pella

    "Leitsilber" Conductive Silver Cement - Systems for Research
    "Leitsilber" Conductive Silver Cement - Systems for Research
    "Leitsilber" Conductive Silver Cement
    "Spectro Tabs Brand", Double Coated - Systems for Research
    "Spectro Tabs Brand", Double Coated - Systems for Research
    "Spectro Tabs Brand", Double Coated
    1", 2", 3", 4" and 6" Silicon Wafers - Systems for Research
    1", 2", 3", 4" and 6" Silicon Wafers - Systems for Research
    1", 2", 3", 4" and 6" Silicon Wafers
    14 SEM Pin Mount Specimen Holder and Box - Systems for Research
    14 SEM Pin Mount Specimen Holder and Box - Systems for Research
    14 SEM Pin Mount Specimen Holder and Box
    144nm Very High Resolution 2D Calibration Standard for AFM - Systems for Research
    144nm Very High Resolution 2D Calibration Standard for AFM - Systems for Research
    144nm Very High Resolution 2D Calibration Standard for AFM
    144nm Very High Resolution 2D Calibration Standard for SEM - Systems for Research
    144nm Very High Resolution 2D Calibration Standard for SEM - Systems for Research
    144nm Very High Resolution 2D Calibration Standard for SEM
    145nm Pitch Calibration Standard for AFM - Systems for Research
    145nm Pitch Calibration Standard for AFM - Systems for Research
    145nm Pitch Calibration Standard for AFM
    2,160 Waffle Grating Replica for STM - Systems for Research
    2,160 Waffle Grating Replica for STM - Systems for Research
    2,160 Waffle Grating Replica for STM
    2000 lines/mm Cross Line Grating Replica - Systems for Research
    2000 lines/mm Cross Line Grating Replica - Systems for Research
    2000 lines/mm Cross Line Grating Replica
    208C High Vacuum Turbo Carbon Coater - Systems for Research
    208C High Vacuum Turbo Carbon Coater - Systems for Research
    208C High Vacuum Turbo Carbon Coater
    292nm Pitch High Magnification, High Resolution Calibration Standard for AFM - Systems for Research
    292nm Pitch High Magnification, High Resolution Calibration Standard for AFM - Systems for Research
    292nm Pitch High Magnification, High Resolution Calibration Standard for AFM
    292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB - Systems for Research
    292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB - Systems for Research
    292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB
    300nm Pitch High Resolution 2D Calibration Standard for AFM - Systems for Research
    300nm Pitch High Resolution 2D Calibration Standard for AFM - Systems for Research
    300nm Pitch High Resolution 2D Calibration Standard for AFM
    300nm Pitch High Resolution 2D Calibration Standard for SEM - Systems for Research
    300nm Pitch High Resolution 2D Calibration Standard for SEM - Systems for Research
    300nm Pitch High Resolution 2D Calibration Standard for SEM
    36° Pin Stub Holder Zeiss/Leo FIB Pre-Tilt - Systems for Research
    36° Pin Stub Holder Zeiss/Leo FIB Pre-Tilt - Systems for Research
    36° Pin Stub Holder Zeiss/Leo FIB Pre-Tilt
    3M™ Copper Conductive Tapes, Single Adhesive Surface - Systems for Research
    3M™ Copper Conductive Tapes, Single Adhesive Surface - Systems for Research
    3M™ Copper Conductive Tapes, Single Adhesive Surface
    45° Cross Section Holder - Systems for Research
    45° Cross Section Holder - Systems for Research
    45° Cross Section Holder
    45° Multi Holder for 3 Pin Stubs - Systems for Research
    45° Multi Holder for 3 Pin Stubs - Systems for Research
    45° Multi Holder for 3 Pin Stubs
    45° Multi Holder for 6 Pin Stubs - Systems for Research
    45° Multi Holder for 6 Pin Stubs - Systems for Research
    45° Multi Holder for 6 Pin Stubs
    45° Multi Holder for 6 Pin Stubs - Systems for Research
    45° Multi Holder for 6 Pin Stubs - Systems for Research
    45° Multi Holder for 6 Pin Stubs
    45° Pin Stub Holder - Systems for Research
    45° Pin Stub Holder - Systems for Research
    45° Pin Stub Holder
    45° Pre-Tilt Holder for Hitachi Mounts and Pin Stubs - Systems for Research
    45° Pre-Tilt Holder for Hitachi Mounts and Pin Stubs - Systems for Research
    45° Pre-Tilt Holder for Hitachi Mounts and Pin Stubs
    45°/90° Combination Holder - Systems for Research
    45°/90° Combination Holder - Systems for Research
    45°/90° Combination Holder
    45°/90° Combination Holder - Systems for Research
    45°/90° Combination Holder - Systems for Research
    45°/90° Combination Holder
    45º / 90º Mount - Systems for Research
    45º / 90º Mount - Systems for Research
    45º / 90º Mount
    45º Mount - Systems for Research
    45º Mount - Systems for Research
    45º Mount
    45º/90º SEM Mount, Ø25mm - Systems for Research
    45º/90º SEM Mount, Ø25mm - Systems for Research
    45º/90º SEM Mount, Ø25mm
    45º/90º SEM Mount, Ø25mm, Ø32, short 6mm pin - Systems for Research
    45º/90º SEM Mount, Ø25mm, Ø32, short 6mm pin - Systems for Research
    45º/90º SEM Mount, Ø25mm, Ø32, short 6mm pin
    45º/90º SEM Mount, Ø25mm, Ø32, short 6mm pin - Systems for Research
    45º/90º SEM Mount, Ø25mm, Ø32, short 6mm pin - Systems for Research
    45º/90º SEM Mount, Ø25mm, Ø32, short 6mm pin
    500nm Diffraction Grating Replica with Latex Spheres - Systems for Research
    500nm Diffraction Grating Replica with Latex Spheres - Systems for Research
    500nm Diffraction Grating Replica with Latex Spheres
    500nm Magnification Calibration Diffraction Grating Replica - Systems for Research
    500nm Magnification Calibration Diffraction Grating Replica - Systems for Research
    500nm Magnification Calibration Diffraction Grating Replica
    500nm SEM Cross Line Grating Replica - Systems for Research
    500nm SEM Cross Line Grating Replica - Systems for Research
    500nm SEM Cross Line Grating Replica
    600 Mesh - Systems for Research
    600 Mesh - Systems for Research
    600 Mesh
    Planotec GSR & Particle Analysis Calibration Kit - Systems for Research
    Planotec GSR & Particle Analysis Calibration Kit - Systems for Research
    60806-5 - Planotec GSR & Particle Analysis Calibration Kit
    70° and 20° EBSD Pre-Tilt Stub Holder, M4 - Systems for Research
    70° and 20° EBSD Pre-Tilt Stub Holder, M4 - Systems for Research
    70° and 20° EBSD Pre-Tilt Stub Holder, M4
    70° and 20° EBSD Pre-Tilt Stub Holder, Pin - Systems for Research
    70° and 20° EBSD Pre-Tilt Stub Holder, Pin - Systems for Research
    70° and 20° EBSD Pre-Tilt Stub Holder, Pin
    70° EBSD Pre-Tilt Holder for Hitachi Mounts and Pin Stubs - Systems for Research
    70° EBSD Pre-Tilt Holder for Hitachi Mounts and Pin Stubs - Systems for Research
    70° EBSD Pre-Tilt Holder for Hitachi Mounts and Pin Stubs
    70° EBSD Pre-Tilt Pin Stub Holder - Systems for Research
    70° EBSD Pre-Tilt Pin Stub Holder - Systems for Research
    70° EBSD Pre-Tilt Pin Stub Holder
    90° Cross Section Holder - Systems for Research
    90° Cross Section Holder - Systems for Research
    90° Cross Section Holder
    A-PAP Pen: Liquid Blocker for Systems for Research
    A-PAP Pen: Liquid Blocker for Systems for Research
    A-PAP Pen: Liquid Blocker
    Acetonitrile - Systems for Research
    Acetonitrile - Systems for Research
    Acetonitrile
    Adjustable Profile Holder - Systems for Research
    Adjustable Profile Holder - Systems for Research
    Adjustable Profile Holder
    Aesculap® Delicate Dissecting Forceps - Systems for Research
    Aesculap® Delicate Dissecting Forceps - Systems for Research
    Aesculap® Delicate Dissecting Forceps
    Aesculap® Dissection Forceps, Smooth Jaws - Systems for Research
    Aesculap® Dissection Forceps, Smooth Jaws - Systems for Research
    Aesculap® Dissection Forceps, Smooth Jaws
    Aesculap® Finepoint Dissecting Forceps, Serrated Tips - Systems for Research
    Aesculap® Finepoint Dissecting Forceps, Serrated Tips - Systems for Research
    Aesculap® Finepoint Dissecting Forceps, Serrated Tips
    Aesculap® Medium Dissecting Forceps, Serrated Tips - Systems for Research
    Aesculap® Medium Dissecting Forceps, Serrated Tips - Systems for Research
    Aesculap® Medium Dissecting Forceps, Serrated Tips
    Aesculap® Specialty Forceps - Systems for Research
    Aesculap® Specialty Forceps - Systems for Research
    Aesculap® Specialty Forceps
    Aesculap® Very Delicate Dissecting Forceps - Systems for Research
    Aesculap® Very Delicate Dissecting Forceps - Systems for Research
    Aesculap® Very Delicate Dissecting Forceps
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