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Bruker NanoIR Probes
Bruker NanoIR Probes
AFM Sample Prep Kit
Bruker Contact mode probes for AFM-IR Type B
Bruker Contact mode probes for AFM-IR Type B - Unmounted
Cantilever Holder for Hitachi HiTech (formerly Seiko)SPA300
Cantilever Holder for Hitachi HiTech (formerly Seiko)SPA400
Cantilever Holder for Innova AFM
Cantilever Holder for Keysight(formerly Agilent)AFMs
Cantilever Holder for Multimode AFM for EX style ThermaLevers
Cantilever Holder for Oxford Instruments/Asylum MFP3D
Cantilever Holder for Shimadzu SPM 3500
Cantilever Holder for Shimadzu SPM 9600
Cantilever Holder for WITec SPM
Cantilever Mounts
LorentzDrive Spare Magnetic Pole Piece
nano-TA Calibration Standards
nanoIR2 Test Sample
Prism Holder for nanoIR™ system
Prism Holder for nanoIR™ system
Prism Substrate
Probe Mounting Fixture Kit
Probes for Conductive AFM
Probes for Fluid Imaging
Probes for Kelvin Probe Force Microscopy
Probes for s-SNOM - Type C (Gold coating For Optimum Spectroscopy)
Probes for s-SNOM, Type B - PtIr
Reduced Height Sample Holder
Standard Height Sample Holder
SThM Test Sample
Tapping mode probes
Tapping mode probes for AFM-IR Type D - Unmounted
Tapping mode/ Tapping AFM-IR probes
Template Stripped Gold Sample Substrate
Test Prism
ThermaLeverTM Probes - nanoTA - 200, pack of 5
ThermaLeverTM Probes - nanoTA - 300, pack of 5
ThermaLeverTM Probes - STHM, pack of 5
ZnS Prism Substrate (Zinc Sulphide)
ZnS Sample Substrate