PR-EX-TnIR-A-10

Tapping mode/ Tapping AFM-IR probes


  • 10 pack of probes for use in the nanoIR2/2S/2FS systems for AFM imaging in Tapping mode and IR spectral collection in contact mode.
    Also required for Tapping AFM-IR chemical imaging where the feature is available.
    Gold coated, microfabricated silicon probes that are ~225 microns long and come pre-mounted on half washer mounts for easy exchange in the AFM head.
    If 5 or more 10 packs of this probe are purchased at the same time then a 10% discount is applied to this line item.

  • Shape: Rotated
    Height: 17 μm - (15 - 19 μm)*
    Setback: 15 μm - (10 - 20 μm)*
    Radius: < 25 nm
    Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
    Coating: Overall gold coating, 70 nm thick
    Shape: Beam
    Force Constant: 3 N/m (1 - 7 N/m)*
    Resonance Frequency: 75 kHz (60 - 90 kHz)*
    Length: 225 μm (215 - 235 μm)*
    Width: 28 μm (23 - 33 μm)*
    Thickness: 3 μm (2 - 4 μm)*
    * typical range