Systems for Research is proud to announce the release of a new white paper titled “In Situ X-ray Approaches in Battery Research” by its leading partner, Sigray.
The paper effectively highlights the development of a suite of groundbreaking lab-based x-ray tools for energy research with performance capabilities approaching that of synchrotron-based approaches.
When it comes to x-ray techniques for battery development, we often look at four commonly used techniques:
This 2/4 part of this white paper series dives more into the use of X-ray absorption spectroscopy with Quantum Leap.
A technique Overview
MicroXRF is an ultrahigh sensitivity approach for elemental mapping and quantification. X-ray Fluorescence occurs when x-rays excite atoms within a sample, promoting inner shell electrons to the outer shells or emitting them from atoms.
This relaxation produces an x-ray. Because the distances between outer shells and inner shells is characteristic to each element, measurement of the x-ray energies emitted by the sample gives not only the elements contained within the illuminated region, but also the quantity.
Sigray AttoMap microXRF is truly unbeatable as it provides unprecedented sensitivity to detect heavy and even light elements (e.g., C, O, N) that are too low concentration to be measured using electron-based techniques such as SEM-EDS and EPMA or other microXRF systems.
Sigray’s patented x-ray energy tunable source and high efficiency double paraboloidal x-ray optics allow the instrument to provide fast, non-destructive chemical mapping at <5 µm resolution and bring the acquisition times down to 2 ms per point. A major advantage of the Attomap is its ability to tune X-ray incident energy to elements of interest to maximize fluorescence cross section. This ability to switch energy can increase sensitivity > 1000X as seen in the figure below.
Figure 1: Sigray AttoMap features a patented x-ray source with multiple x-ray targets (each target produces a different x-ray spectra). Arsenic from the same sample is shown using two different x-ray targets: tungsten and molybdenum to illustrate the major gains in sensitivity possible.
Application in Battery Research
Attomap provides high sensitivity detection levels down to sub-ppm levels for transition elements commonly used in battery research.
Unique to the AttoMap is its strength in trace-level detection (e.g., sub-0.01%) of important low Z elements such as Al, Mg, Na, F, S, P, and organics (C, O, N). This is achieved using a tilted goniometer stage and a high vacuum enclosure with 10E-5 Torr. The ability to tilt the sample stage in the Attomap also allows elemental analysis to vary from deep to shallow interaction volumes.
AttoMap’s High Sensitivity: A Key Advantage
Sigray has developed a correlative workflow to first identify the location of potential impurities using transmission X-ray microscopy, followed by AttoMap microXRF to identify the chemical composition of these impurities.
Systems for Research (SFR) is a proud partner of Sigray, the leading name in X-Ray Microscopy and we are diving into the potential of this suite of spectroscopy and laboratory tools in a four-part series. Stay tuned as we dive into part ¾ of this series as we discover more about X-ray Microscopy with EclipseXRM and Apex XCT.
A pillar of contemporary scientific research, nanotechnology - the manipulation of matter at the atomic and molecular scale, has emerged as a cornerstone of modern scientific inquiry, offering unprecedented opportunities across a multitude of disciplines. In this blog, we embark on a journey to explore the diverse and transformative applications of nanotechnology, ranging from healthcare and electronics to environmental remediation and beyond.
X-ray microscopy (XRM) is a powerful tool for the analysis of the structure of materials at various length scales, ranging from microns to nanometers. The approach measures the absorption of x-rays to form images of the internal structures of intact samples after or during charging cycles.