SFR Hosts Exclusive Mixer at CSC 2019 in Quebec City

June 10, 2019 1 min read

SFR Hosts Exclusive Mixer at CSC 2019 in Quebec City

SFR is a proud sponsor and participant of the annual Canadian Chemistry Conference and Exhibition.

The CSC 2019 conference took place June 3rd-June 7th in Quebec City, Quebec and was themed “Celebrating IUPAC’s 100th Anniversary: Canada’s Place in Global Chemical Research, Innovation and Education.”

Like every year, SFR takes great pride in hosting our exclusive Materials Division Mixer at the CSC. This year we brought together Canadians and international chemistry-materials community members for an evening of fun, great discussions, amazing food and drinks at l’Atelier.

 SFR was excited to bring the Phenom ProX Desktop SEM to the conference and spent much of the time doing demos for all the intrigued visitors at the booth.

The Phenom SEM microscopes are intuitive to use, create results quickly and built with quality in mind. The Phenom ProX Desktop SEM is the most extended solution for fast and user-friendly imaging and analysis. It has additional sample holders that allow for example sample tilting and cooling for imaging an even greater diversity of samples.

  

Interested in a demo? Interested in having the Phenom ProX Desktop visit your lab or organization? Contact us at sales@sfr.ca! 



Also in News

Applications of Nanotechnology: Building at the Nanoscale
Applications of Nanotechnology: Building at the Nanoscale

February 21, 2024 2 min read

A pillar of contemporary scientific research, nanotechnology -  the manipulation of matter at the atomic and molecular scale, has emerged as a cornerstone of modern scientific inquiry, offering unprecedented opportunities across a multitude of disciplines. In this blog, we embark on a journey to explore the diverse and transformative applications of nanotechnology, ranging from healthcare and electronics to environmental remediation and beyond. 

Read More
TOF-SIMS Technique: Advanced Ion Beam Technology for Surface Analysis
TOF-SIMS Technique: Advanced Ion Beam Technology for Surface Analysis

February 07, 2024 2 min read

An acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time-of-Flight mass analysis (TOF), this sensitive technique is well established for many industrial and research applications.
Read More
X-ray Diffraction (XRD) to study the crystal structure and bond lengths of battery materials.
X-ray Diffraction (XRD) to study the crystal structure and bond lengths of battery materials.

January 31, 2024 3 min read

X-ray microscopy (XRM) is a powerful tool for the analysis of the structure of materials at various length scales, ranging from microns to nanometers. The approach measures the absorption of x-rays to form images of the internal structures of intact samples after or during charging cycles.

 

Read More