SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
Small tube, needle or wire clamp based on a standard Ø12.7mm (1/2") pin stub. Ideal for examining wire cross-sections or needle tips. Holds tube, wires and needles up to Ø2mm (0.08"); hole is 6.5mm (1/4") deep. Material: vacuum grade aluminum with a stainless steel set screw. Allen wrench included.
Screw used is 2-56 x 1/8, Set Cup, SS
Tube/Needle Clamp, Ø12.7mm, pin