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PR-EX-AN2-300-5
The AN-2 probes are designed for nano-TA and HT-AFM. For SThM mode, the GLA-1 probes are required. These probes come in two lengths:
200 µm: Better suited for tapping or AC mode.
300 µm: Optimized for contact mode.
They are pre-mounted to larger mounts for easier handling and reliable electrical connection, and are sold in packs of 5.
| Feature | Value |
|---|---|
| Geometry | Rectangular |
| Tip Radius (nm) | Nominal: 15.0, Max: 30.0 |
| Frequency (kHz) | Nominal: 30, Min: 10, Max: 50 |
| Length (µm) | Nominal: 345, Min: 335, Max: 355 |
| Spring Constant (N/m) | Nominal: 0.35, Min: 0.05, Max: 0.65 |
| Width (µm) | Nominal: 15, Min: 13, Max: 16 |
| Feature | Value |
|---|---|
| Material | Single Crystal Si |
| Tip Height (µm) | 5.0 |
| Front Angle (º) | 17.5 ± 2.5 |
| Back Angle (º) | 25.0 ± 2.5 |
| Side Angle (º) | 20.0 ± 2.5 |
| Feature | Value |
|---|---|
| Material | Single Crystal Si |
| Geometry | Rectangular |
| Number of Cantilevers | 1 |
| Thickness (µm) | Nominal: 2.2, Range: 1.8 – 2.6 |
| Back Side Coating | Optional Reflecti |