TESPW-V2

TESPW-V2

37N/m, 320kHz, No Reflex Coating, Wafer

  • A wafer of High quality etched silicon probes for TappingModeâ„¢ and other non-contact modes. Unmounted for use on standard AFM's.

    Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.

    The new design provides:

    • Tighter dimensional specifications for improved probe to probe consistency
    • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
    • Improved probe quality and aesthetics

    This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPAW-V2.


  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5º
    Back Angle: 17.5 ± 2.5º
    Side Angle: 20 ± 2.5º
    Tip Radius (Nom): 7
    Tip Radius (Max): 10
    Tip Set Back (Nom): 13.5
    Tip Set Back( RNG): 11.5 - 15

  • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 3.3
    Cantilever Thickness (RNG): 2.8 - 3.8
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1
    Back Side Coating: Reflective Aluminum