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    Web Store / Products / TESPW-V2
    TESPW-V2 - Systems for Research

    TESPW-V2

    TESPW-V2

    Price On Request - CONTACT US FOR QUOTE
    37N/m, 320kHz, No Reflex Coating, Wafer

    • A wafer of High quality etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's.

      Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.

      The new design provides:

      • Tighter dimensional specifications for improved probe to probe consistency
      • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      • Improved probe quality and aesthetics

      This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPAW-V2.


    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5º
      Back Angle: 17.5 ± 2.5º
      Side Angle: 20 ± 2.5º
      Tip Radius (Nom): 7
      Tip Radius (Max): 10
      Tip Set Back (Nom): 13.5
      Tip Set Back( RNG): 11.5 - 15

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 3.3
      Cantilever Thickness (RNG): 2.8 - 3.8
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum