TESPW-V2
A wafer of High quality etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.
The new design provides:
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPAW-V2.
Tip Geometry: | Standard (Steep) |
Tip Height: | 10 - 15 |
Front Angle: | 25 ± 2.5º |
Back Angle: | 17.5 ± 2.5º |
Side Angle: | 20 ± 2.5º |
Tip Radius (Nom): | 7 |
Tip Radius (Max): | 10 |
Tip Set Back (Nom): | 13.5 |
Tip Set Back( RNG): | 11.5 - 15 |
Cantilever Material: | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
Cantilever Thickness (Nom): | 3.3 |
Cantilever Thickness (RNG): | 2.8 - 3.8 |
Cantilever Geometry: | Rectangular |
Cantilevers Number: | 1 |
Back Side Coating: | Reflective Aluminum |