Etched Silicon Probe, TESPA-V2, 10-pack, Au Reflex Coated

  • Pack of 10 High quality etched silicon probes for TappingMode™ and other
    non-contact modes. Unmounted for use on standard AFM's.

    Bruker AFM Probes has introduced an improved version of its popular,
    TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium
    etched silicon probes set the industry standard for TappingMode™ and
    non-contact mode in air.

    The new design provides:
    • Tighter dimensional specifications for improved probe to probe
    • Tighter alignment of the tip apex to the cantilever resulting
    in easier laser positioning over the tip
    • Improved probe quality & aesthetics

    This AFM probe is unmounted for use on any AFM and is also available
    without Aluminum reflex coating as model TESP-V2.

    The current model TESPA is available for ordering through early 2014 at
    which point, it will become obsolete.