Pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.
The new design provides: • Tighter dimensional specifications for improved probe to probe consistency • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip • Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2.
The current model TESPA is available for ordering through early 2014 at which point, it will become obsolete.
