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Tapping Mode AFM Probe with Long Cantilever

  • Tapping Mode AFM Probe with Long Cantilever

    Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

    The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

    The AFM holder chip fits most commercial AFM systems as it is industry standard size.

    BudgetSensors' Tap190-G features a longer cantilever and it is meant as an alternative to BudgetSensors' Tap300 probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.

  • AFM Tip

    SHAPE Rotated
    Tip Height 17µm - From 15µm To 19µm
    Tip Setback 15µm - From 10µm To 20µm
    Tip Radius < 10nm
    Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
  • AFM Cantilever

    Shape Beam
    Force Constant 48N/m - From 28N/m To 75N/m
    Resonance Frequency 190kHz - From 160kHz To 220kHz
    Length 225µm - From 215µm To 235µm
    Width 38µm - From 33µm To 43µm
    Thickness 7µm - From 6µm To 8µm