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Gold Coated Soft Tapping Mode Probe

  • Gold Coated Soft Tapping Mode Probe

    Monolithic silicon AFM probe for soft tapping mode operation.

    The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

    The AFM holder chip fits most commercial AFM systems as it is industry standard size.

  • AFM Tip

    SHAPE Rotated
    Tip Height 17µm - From 15µm To 19µm
    Tip Setback 15µm - From 10µm To 20µm
    Tip Radius < 10nm
    Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
  • AFM Cantilever

    Shape Beam
    Force Constant 5N/m - From 1.5N/m To 15N/m
    Resonance Frequency 150kHz - From 75kHz To 225kHz
    Length 125µm - From 115µm To 135µm
    Width 25µm - From 20µm To 30µm
    Thickness 2.1µm - From 1.1µm To 3.1µm