SCM-PIT-V2
Bruker's new SCM-PIT-V2 probe replaces the legacy SCM-PIT probe.
Built on the high-performance RFESP-75 AFM probe, Bruker's SCM-PIT-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical characterizationapplications. The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip. The coating on the back side of the cantilever compensatesfor the stress created by the front side coating and also enhances laserreflectivity by a factor of up to 2.5 times.
AFM users with Bruker's latest electrical characterization techniquesbased upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.
The new design provides:
Tip Geometry: | Rotated |
Tip Height: | 10 - 15 |
Front Angle: | 17.5 ± 2.5 |
Back Angle: | 25 ± 2.5 |
Side Angle: | 20 ± 2.5 |
Tip Radius (Nom): | 25 |
Tip Coating: | PtIr |
Tip Set Back (Nom): | 9.5 |
Tip Set Back( RNG): | 7 - 12 |
Cantilever Material: | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
Cantilever Thickness (Nom): | 2.8 |
Cantilever Thickness (RNG): | 2.05 - 3.55 |
Cantilever Geometry: | Rectangular |
Cantilevers Number: | 1 |
Front Side Coating: | Conductive PtIr |
Back Side Coating: | Reflective PtIr |