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    Web Store / Products / SCM-PIC-V2
    SCM-PIC-V2 - Systems for Research

    SCM-PIC-V2

    SCM-PIC-V2

    $738.40
    Conductive Probes, 0.1N/m, 10kHz, 10-Pack

    • ***Note: Bruker's new SCM-PIC-V2 probe replaces the legacy SCM-PIC  probe. Bruker recommends transitioning to this probe. The legacy SCM-PIC is still available for ordering while supplies last, at which point in will become obsolete.

      Built on the high-performance RESP-10 AFM probe, Bruker's SCM-PIC-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications. The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip. The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.

      AFM users with Bruker's latest electrical characterization techniques based upon PeakForce Tapping technology should consider using PFTUNA or PFQNE-AL probes.

      The new design provides:

      • Tighter dimensional specifications for improved probe to probe consistency
      • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      • Improved probe quality and aesthetics
    • This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.

      Tip Geometry: Rotated
      Tip Height: 10 - 15
      Front Angle: 17.5 ± 2.5
      Back Angle: 25 ± 2.5
      Side Angle: 20 ± 2.5
      Tip Radius (Nom): 25
      Tip Coating: PtIr
      Tip Set Back (Nom): 9.5
      Tip Set Back( RNG): 7 - 12
    • The Platinum-Iridium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.

      Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 1.8
      Cantilever Thickness (RNG): 1.05 - 2.55
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Front Side Coating: Conductive PtIr
      Back Side Coating: Reflective PtIr