***Note: Bruker's new SCM-PIC-V2 probe replaces the legacy SCM-PIC probe. Bruker recommends transitioning to this probe. The legacy SCM-PIC is still available for ordering while supplies last, at which point in will become obsolete.
Built on the high-performance RESP-10 AFM probe, Bruker's SCM-PIC-V2 probe has a Platinum-Iridium coated,electrically conductive tip that is ideal for Electrical Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and other electrical characterization applications. The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip. The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2.5 times.
The new design provides:
|Tip Height:||10 - 15|
|Front Angle:||17.5 ± 2.5|
|Back Angle:||25 ± 2.5|
|Side Angle:||20 ± 2.5|
|Tip Radius (Nom):||25|
|Tip Set Back (Nom):||9.5|
|Tip Set Back( RNG):||7 - 12|
|Cantilever Material:||0.01 - 0.025 Ωcm Antimony (n) doped Si|
|Cantilever Thickness (Nom):||1.8|
|Cantilever Thickness (RNG):||1.05 - 2.55|
|Front Side Coating:||Conductive PtIr|
|Back Side Coating:||Reflective PtIr|