A wafer of High quality etched silicon probes for contact mode imaging in air.
Unmounted for use on standard AFM's.
Bruker's flagship RESP probes are the preferred choice for high-sensitivity silicon probe imaging in contact mode in air. Every aspect of the RESP design has been optimized to provide the most accurate profiling of microscopic features. With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the RESP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types.
The new design provides:
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RESPAW-20
|Tip Geometry:||Rotated (Symmetric)|
|Tip Height:||10 - 15|
|Front Angle:||15 ± 2|
|Back Angle:||25 ± 2|
|Side Angle:||17.5 ± 2|
|Tip Radius (Nom):||8|
|Tip Radius (Max):||12|
|Tip Set Back (Nom):||9.5|
|Tip Set Back( RNG):||7 - 12|
|Cantilever Material:||0.01 - 0.025 Ωcm Antimony (n) doped Si|
|Cantilever Thickness (Nom):||3.25|
|Cantilever Thickness (RNG):||2.5 - 4.0|