SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
5mm recess allows for background free imaging and no contact with sample surface in imaging area. Clamping area is 25mm (1") long and 15mm (0.6") wide. Maximum thickness 7mm under the clamping strips. Overall dimensions 33 x 25 x 11mm 1.3" x 1" x 0.43"). Material: machined aluminum with brass screws.
Screw used is M2 x 10mm, Pan, Brass and M2 x 6mm, Pan, Brass
Recessed PELCO SEMClamp™ 25 x 15mm, 3.2mm (1/8") Pin