Includes 1µm, 10µm and 100µm pitch
The Pelcotec™ G-1 calibration specimen with a 1µm pitch grid is very useful for magnification calibration or image distortion check in the 100x to 10,000x magnification range. Can be used for SEM, Auger, Sims, FIB, and LM (reflected light). Specimen may also be mounted directly on the Pelcotec™ G-1 which will give an accurate internal calibration in the image. Particularly useful when working with powders. Possible alternative for the SIRA calbration specimen (0.462µm pitch) which is no longer available.
The Pelcotec™ G-1 has the following specifications:
To avoid contamination of test and calibration samples, we recommend storing these under vacuum. For the standard SEM pin mounts, the #16179 PELCO® SEM Sample Stub Vacuum Desiccatorwould be ideal.
Details for Pelcotec™ G-1 Calibration Specimen
NIST Traceable Pelcotec™ G-1T Calibration Standards.
633-1 Sample Certificate of Traceability (157KB PDF)
Individually Certified Pelcotec™ G-1C Calibration Standards.
633-11 Sample Certificate of Calibration (185KB PDF)