SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder and located under the scanning beam. The STEM image is created by the adjustable Pt conversion plate which must face the chamber SE-detector. Cost-effective method for STEM imaging by using the existing SE detector in the SEM chamber. The included conductive anti-scatter sleeve, placed between the holder and the SEM pole piece, contains secondary electron from the sample surface and prevents these from being detected; the result is clear STEM imaging. Overall height with anti-scatter sleeve is 37.5mm (1-1/2") and 29.2 (1.15") without the anti-scatter sleeve. Material: vacuum grade aluminum, brass grid holder, platinum conversion plate and conductive plastic.
STEM images of Lacey carbon made with the PELCO® STEM Imaging Holder on an FEI XL30 FEG-SEM using 15kV.
Screws used are M2 x 10mm, Flat Head, Brass and M2 x 6mm, Pan, Brass and M2 x 3mm, Set, SS
PELCO® STEM Imaging Holder, Pin