SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
The PELCOÂ® single FIB sample and Grid holder holds an FIB sample mounted on standard 1/2" (12.7mm) pin stub for FIB milling and lift-out procedures. It also holds two FIB grids conveniently close to the sample to mount prepared TEM lamellae on the FIB grid for subsequent TEM imaging Compact and cost effective holder suitable for all FIB/SEM systems which accept pin mount holders, such as the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems a pin mount adapter is needed. Made of vacuum grade aluminum with brass screws. Philips screwdriver #0 included. Overall size is 22.4 x 12.7 x 11.7mm (0.88" x 0.5" x 0.46"). Standard 3.2mm (1/8") pin.
15467 - PELCOÂ® Single 1/2" FIB Sample and Grid Holder, Pin, each
15464-20 - Replacement Brass Screws, pkg/10