SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
12.5mm (1/2") high, pin stub extender allows bringing pin stubs and pin stub sample holders closer to the pole piece without moving the SEM sample stage. Multiple extenders are stackable. Compatible with all standard 3.2mm (1/8") pin stubs or pin stub SEM holders with maximum pin length of 10mm (0.4"). Made of vacuum grade aluminum with stainless steel allen set screw. Allen key included
Screw used is M3 x 3mm, Set, SS
PELCO® Pin Stub Extender, 12.5mm (1/2"), 3.2mm (1/8") Pin