• High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm. Ideally suited to long lifetime imaging on low relief samples at moderately high resolution. Conductive with a contact resistance in the 100kOhm range. Intermediate spring constant of 8N/m. For even higher resolution consider the AD series of diamond probes.

    Applications include

    • Topography imaging in PeakForce Tapping, Tappingmode, and contact mode.
    • Electrical characterization with PeakForce TUNA, TUNA, CAFM.
    • Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation.
  • Highly wear resistant, single crystal boron-doped diamond probes. Conductive with a contact resistance in the 100kOhm range. 20nm end radius.

    Tip Geometry: Standard
    Tip Height: 12.5 +/- 2.5
    Front Angle: 25+/-5
    Back Angle: 15+/-5
    Side Angle: 22.5+/-5
    Tip Radius (Nom): 20
    Tip Coating: Highly conductive single cystal diamond
    Tip Set Back (Nom): 15-25
    Tilt Compensation: 1 +/- 1

  • Cantilever Material: Diamond cone probe, 100N/m
    Cantilever Thickness (Nom): 4
    Cantilever Thickness (RNG): 3.5-4.5
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1
    Back Side Coating: Reflective Au