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Standard Force Modulation AFM Probe

  • Standard Force Modulation AFM Probe

    Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) operation.

    The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

    The AFM holder chip fits most commercial AFM systems as it is industry standard size.

    For measurements in liquids please use the back side gold coated Multi75GD-G or the overall gold coated Multi75GB-G!

  • AFM Tip

    SHAPE Rotated
    Tip Height 17µm
    From 15µm To 19µm
    Tip Setback 15µm
    From 10µm To 20µm
    Tip Radius < 10nm
    Half Cone Angle 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex
  • AFM Cantilever

    Shape Beam
    Force Constant 3N/m - From 1N/m To 7N/m
    Resonance Frequency 75kHz - From 60kHz To 90kHz
    Length 225µm - From 215µm To 235µm
    Width 28µm - From 23µm To 33µm
    Thickness 3µm - From 2µm To 4µm