Electrostatic Force Microscopy (EFM) probe holder for the Multimode SPM.
This stainless steel probe holder enables electric field gradient imaging for the MultiMode SPM. The holder provides electrical contact to the AFM tip through both the cantilever clip and the stainless steel cantilever pocket. An integrated piezo oscillates the tip for TappingMode. This holder can also be used for Contact, Magnetic Force Microscopy (MFM), and Surface Potential Microscopy (SPoM) modes. This accessory includes a support note. NanoScope IV, IVa, or V Control Stations, or the IIIa or IIIdControl Stations with Extender Electronics or newer Quadrex ExtenderElectronics (Model QUADREX) are strongly recommended for the bestpossible images, including phase/frequency detection and surfacepotential measurements.
This holder is also a replacement for the previous models MMMC, MC and MMNISCH.
This e-field air-Tapping probe holder has identical capabilities to the previous air-Tapping probe holder (MMMC), except that it allows application of a tip bias. *Note: Replaces previous part #MMMC, MC and MMNISCH
