Micro Vise

  • SEM Pin Mount Specimen Holders
    for Scanning Electron Microscopy

    A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
    Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs

    compatible with pin stub holder

    A fast and clean way to hold specimens for SEM. The jaws are 25.4mm (1") wide. Maximum gap is 11mm (7/16"). Material: machined aluminum with stainless steel allen screw. Allen wrench included.

    Screws used are 6-32 x 3/4 Soc Head, Vent and 6-32 x 5/16 Flat Head, SS
    Micro Vise, 3.2mm (1/8") pin