SEM Pin Mount Specimen Holders
for Scanning Electron Microscopy
A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs
Specimen holder for 1-1/2" and 40mm metallurgical mounts. Standard pin stub 3.2mm (1/8"). Material: machined aluminum with stainless steel allen screws. Depth is 8mm (5/16"). Allen wrench included. Shown holding a specimen, bottom.
Screws used are M3 x 6mm Soc Cap, SS and M3 x 12mm Soc Cap, SS
Metallurgical Mount Holder, 1-1/2" and 40mm dia., 3.2mm (1/8") dia. Pin