A wafer of High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes.
Unmounted for use on standard AFM's
Bruker AFM Probes has introduced an improved version of its popular, LTESP/LTESPA AFM probes. Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air.
The new design provides:
Tighter dimensional specifications for improved probe to probe consistency
Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
Improved probe quality and aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPW-V2
10 - 15
25 ± 2.5
15 ± 2.5
22.5 ± 2.5
Tip Radius (Nom):
Tip Radius (Max):
Tip Set Back (Nom):
Tip Set Back( RNG):
5 - 25
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
0.01 - 0.025 Ωcm Antimony (n) doped Si
Cantilever Thickness (Nom):
Cantilever Thickness (RNG):
5.8 - 7.8
Back Side Coating:
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