LTESP-V2

LTESP-V2

48N/m, 190kHz, 4-Sided Tip, No Coatings, 10-Pack

  • A pack of 10 High quality long-lever etched silicon probes for TappingModeâ„¢ and other non-contact modes.

    Unmounted for use on standard AFM's.

    Bruker AFM Probes has introduced an improved version of its popular, LTESP/LTESPA AFM probes. Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air.

    The new design provides:

    • Tighter dimensional specifications for improved probe to probe consistency
    • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
    • Improved probe quality and aesthetics

    This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2.


  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5
    Back Angle: 15 ± 2.5
    Side Angle: 22.5 ± 2.5
    Tip Radius (Nom): 8
    Tip Radius (Max): 12
    Tip Set Back (Nom): 15
    Tip Set Back( RNG): 5 - 25

  • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 6.8
    Cantilever Thickness (RNG): 5.8 - 7.8
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1