Large Double Slotted Vise

  • SEM Pin Mount Specimen Holders
    for Scanning Electron Microscopy

    A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9).
    Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs

    Large Double Slotted Set Screw Vise with 2 ea. 2.5mm by 5mm deep slots. Dimensions ø25x8 mm (1 x 0.32") with 3.2mm (1/8") pin. Clamp thin specimens and cross sections without the need for tape or conductive paint. Material: machined aluminum with 2 stainless steel allen set screws. Allen wrench included.

    Screw used is M3 x 6mm, Flat, Set, SS
    Large Double Slotted Set Screw Vise, Ø25mm