2.8N/m, 75kHz, 4 Sided Tip, No Coatings, Wafer

  • A wafer of High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air.

    Unmounted for use on standard AFM's.

    Bruker AFM Probes has introduced an improved version of its popular, FESP/FESPA AFM probes. Bruker’s new line of FESP high quality premium etched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air.

    The new design provides:

    • Tighter dimensional specifications for improved probe to probe consistency
    • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
    • Improved probe quality and aesthetics

    This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model FESPAW-V2.

  • Tip Geometry: Standard (Steep)
    Tip Height: 10 - 15
    Front Angle: 25 ± 2.5
    Back Angle: 15 ± 2.5
    Side Angle: 22.5 ± 2.5
    Tip Radius (Nom): 8
    Tip Radius (Max): 12
    Tip Set Back (Nom): 15
    Tip Set Back( RNG): 5 - 25

  • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
    Cantilever Thickness (Nom): 2.75
    Cantilever Thickness (RNG): 2.0 - 3.5
    Cantilever Geometry: Rectangular
    Cantilevers Number: 1